EyeC shows AI-based inspection technology at Labelexpo Americas

EyeC-America, provider of automated artwork verification and print image inspection systems, will exhibit at Labelexpo Americas 2024 in Rosemont from September 10-12 at booth #1535. The Chicago-based company will showcase its latest developments, including live demonstrations of the new EyeC ProofRunner options for AI-based defect classification and the improved EyeC Proofiler DT series. 

EyeC will be highlighting the newest in-line inspection system - The EyeC ProofRunner Highlight. 

The ProofRunner is being demonstrated along with the rewinder using the valuable partnership with Prati. Two more EyeC ProofRunner systems are on display at Rotoflex Finishing and Converting Solutions (Mark Andy booth #424) and VEMAX Finishing Solutions (booth #423).  

The modern inline inspection system offers fast and precise 100 percent print inspection for labels and flexible packaging with web widths of up to 1,700 mm. Brand new options for the entire EyeC ProofRunner line will be presented for the first time to the US market, demonstrating the power of AI-based defect classification. With precise defect classification based on the image content, relevant defects can be identified more clearly and brought to the operator's attention. 

Another trade fair highlight will be the improved EyeC Proofiler 1200 DT presentation. In addition to technical improvements for optimized speed, handling, and ease of maintenance, the scanner-based inspection system with its fresh design sets new standards in the quality control of large-format print samples. Live demonstrations are also planned for the EyeC Proofiler Graphic, an artwork proofreading software for automatically comparing print-ready or step-and-repeat files with approved artwork. 

Leveraging the latest RFID technology, EyeC enables seamless product tracking and monitoring. The innovative products ensure RFID chips, offering error-free processing. The software conducts precise measurements and comparisons to maintain quality control by identifying deviations from the original PDF. Additionally, the systems are adept at verifying the integrity of the reflective materials commonly utilized in chips, ensuring reliability across various applications.